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  • Bruker to Present World’s First Handheld XRF to Have Silicon Drift Detector (SDD) at Stainless Steel World Conference in Texas

    (EMAILWIRE.COM, August 26, 2008 ) KENNEWICK, Washington-- Bruker AXS today announced it will present its new TRACERturboSD (TM), the world’s first handheld X-ray Fluorescence (XRF) instrument with a Silicon Drift Detector (SDD), at the Stainless Steel World America Conference & Exhibition near Houston September 9th and 10th. This technology breakthrough provides dramatically improved speed, sensitivity and resolution to the metals industries. Bruker's industry-leading proprietary XFlash™ SDD, previously available only in high-performance laboratory XRF instruments, now offers unprecedented speed and analytical specificity when integrated into the novel handheld TRACERturboSD.

    With this introduction, the Bruker AXS Handheld business, previously well-known worldwide as Keymaster Technologies Inc., builds on its long tradition of technology leadership in the handheld XRF industry that includes:
    • 2001 - First tube-based handheld XRF
    • 2004 - First vacuum handheld XRF, co-invented with NASA
    • 2008 – First SDD-based handheld XRF

    The revolutionary TRACERturboSD with integrated SDD offers unparalleled speed, sensitivity and energy resolution that has been previously found only in more expensive laboratory systems. Now all handheld XRF customer segments can benefit from these compelling performance advantages in their metal analysis. The much better SDD energy resolution offers a significant gain in specificity and information content. In the aerospace industry, for example, the proprietary Bruker SDD technology enables TRACERturboSD users to better and faster analyze sophisticated light alloys such as aluminum, even without the use of a vacuum or helium attachment. In the general metals analysis and fabrication markets, the TRACERturboSD offers higher speed, sensitivity and selectivity for very demanding handheld XRF applications.

    Besides the new high-end TRACERturboSD, Bruker AXS continues to offer its standard S1 Tracer™ handheld instrument with traditional SiPIN diode technology for routine analysis. In addition, the well-known joint Bruker-NASA vacuum technology can be combined with the SDD for the ultimate in light-element sensitivity in a high-performance handheld XRF instrument.

    John Landefeld, Vice President of Bruker AXS Handheld commented "We are certainly proud to present this cutting-edge next-generation handheld XRF instrument, incorporating our proprietary XFlash SDD technology. The TRACERturboSD provides enormous analytical benefits to handheld XRF users, and really represents a disruptive technology in this field."

    He added: "This XRF breakthrough continues our tradition of technology leadership, going back to the initial introduction of tube-based XRF handhelds in 2001. Following the joint NASA-Bruker development of vacuum technology for handhelds in 2004, Bruker proves, once again, to be the technology leader in advanced handheld XRF instrumentation."

    "The metals communities will be especially pleased to find that high-end handheld XRF can now approach the capabilities of laboratory systems,” concluded John Patterson, Director of Marketing and Product Management of Bruker AXS Handheld.

    Bruker will also exhibit the new handheld SDD instrument at Fabtech 2008 October 6-8 in Las Vegas. For more TRACERturboSD information, please visit: www.bruker-axs.com/handheld and booth 506 at the Stainless Steel World conference taking place at The Woodlands Waterway Marriott Hotel & Convention Centre in The Woodlands Texas near Houston.

    For more information about Bruker AXS and Bruker Corporation, please visit www.bruker-axs.com and www.bruker.com.

    John I.H. Patterson
    Bruker AXS Handheld Inc.
    Director of Marketing and Product Management
    Telephone: +1-609-847-9468
    Email: jpatterson@BrukerHandheld.com

    Michael Willett
    978-663-3660 1411

    Source: EmailWire.com

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